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Title: BuckingBeam :: Superior, Handcrafted Vertical Probe Applications for Precision Testing
Description: BucklingBeam creates superior, handcrafted vertical probe applications that empower the world’s leading flip-chip semiconductor manufactures with precision testing capabilities.
Keywords:Vertical probe card, buckling beam, probe card, probe card test, wafer test, package test, final test, QFN, CSP, WLCSP, Southwest Test, southwest test workshop, cobra, cobra probe, wentworth, cascade, microprobe, bucklingbeam, Kelvin probe, space transformer, mipox, probe clean, socket, wafer probe, probe,
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